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ADSYS announces board ATE i 7000 series test platform.
發表時間:2011-11-11 此文章有12489人閱覽

ADSYS announce their latest ATE i7000 Series.

1. Component level MDA test and circuit level ATE test can do in the same platform at the same time.
2. Cost effective: Integrated MDA module and function module at any time you want to accomplish your complicated test work.
3. Both MDA and ATE automatic switch, additional fixture isolation does not require.
4. Security: your already exist function module can integrated as a partial of this system through software or hardware linking. You need not to tell us the detail technique about you products.
5. Flexibility: you can bundle any test module from current system easily upon you products innovation. You can update your system just in time.
6. Nature graphic simulation interface, so that you can debug your test program very easily.

1. Data base architecture, the test results data write to data base to realize central data acquisition, analysis, remote monitoring facilities.
2. Supply a DC constant voltage constant current from a programmable power supply (PPS) to DUT to protect the damage through the test.
3. Supply AC220V/110V AC from AC source, voltage, frequency and trip protect is essential.
4. Dynamic test: test the voltage, current, waveform, frequency at the test point you assigned, and simulation the test activities through dry contact relay to accomplish the fully automatic test.
5. Support 14sets per card 0.5ms 1 Amp high speed dry contact relay card, maximum 42 sets contact relay to realize the manipulation of the test.
6. Support 10 sets per card maximum 30 sets 16A/250V high current dry relay contact facility to expan the additional power module for this system.
7. Flexible architecture:combine 3/6/11 wires measurement, you can choose the best solution for your test need.
8. Digital input function: 32 channels per switch card, maximum 128 channels digital input to monitoring the test data in the DUT.


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